Ключевые слова: presentation, HTS, REBCO, coated conductors, doping, fabrication, IBAD process, PLD process, high rate process, doping, coils pancake, current-voltage characteristics, uniformity, Jc/B curves, angular dependence, critical current, magnetic field dependence, mechanical properties, thickness dependence, fatigue behavior, stress effects, strain effects
Yoshida Y., Iijima Y., Furuse M., Kakimoto K., Fujita S., Yoshida T., Daibo M., Ohsugi M., Hirata W.
Iijima Y., Awaji S., Kiss T., Kakimoto K., Fujita S., Yoshida T., Daibo M., Okada T., Muto S., Hirata W.
Ключевые слова: HTS, EuBCO, coated conductor modules, fabrication, PLD process, IBAD process, pinning, doping effect, pinning centers artificial, growth rate, critical caracteristics, critical current distribution, microstructure, Jc/B curves, pinning force, critical current density, angular dependence, critical current, magnetic field dependence, experimental results
Iijima Y., Awaji S., Kiss T., Kakimoto K., Fujita S., Igarashi M., Adachi Y., Naoe K., Yoshida T., Okada T., Muto S., Hirata W.
Ключевые слова: HTS, EuBCO, coated conductors, long conductors, PLD process, IBAD process, doping effect, pinning centers artificial, fabrication, critical caracteristics, critical current, angular dependence, thickness dependence, temperature dependence, pinning force, magnetic field dependence, microstructure, homogeneity, experimental results, length
Iijima Y., Kiss T., Iwakuma M., Sato H., Fujita S., Igarashi M., Hanyu S., Naoe K., Kurihara C., Nakamura N., Daibo M., Muto S., Hirata W.
Iijima Y., Higashikawa K., Awaji S., Kiss T., Kakimoto K., Fujita S., Igarashi M., Fukuzaki T., Adachi Y., Naoe K., Yoshida T., Daibo M., Muto S., Hirata W.
Ключевые слова: HTS, GdBCO, EuBCO, coated conductors, fabrication, doping effect, PLD process, IBAD process, uniformity, homogeneity, substrate Hastelloy, critical caracteristics, critical current density, pinning force, magnetic field dependence, Jc/B curves, critical current, angular dependence, microstructure, temperature dependence, experimental results
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.